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FIB-SEM tomography o a CMOS image sensor: 533 serial cross-sectional BSE images of a CMOS image sensor were automatically acquired on a FIB-SEM in 14 hours. Reconstructed 3D data visualizes the arrangement of electrodes and wiring. Slice images gave layer descriptions of the color filter, the plugs with a diameter of about 200 nm, and the metal wiring with the minimum width of approximately 150 nm respectively.
onsemi’s indirect Time-of-Flight (iTOF) demo at Embedded World shows a 1.2MP sensor that can capture depth maps up to six meters.