Scanning Microwave Impedance Microscopy

Image Sensors World        Go to the original article...

Chipworks says that scanning microwave impedance microscopy (sMIM), a new scanning probe microscopy (SPM) technique, might replace traditional scanning capacitance microscopy (SCM). Like SCM, the new sMIM technique reveals information on the implanted dopant structures of a semiconductor device.

sMIM Hardware Simplified Schematic Diagram

Chipworks publishes cross-sectional and plan-view images of the pixels of the OmniVision OV2D7AG, which is a 175 kilo-pixel, FSI global shutter, infrared CMOS sensor from the Amazon Fire Phone:

Go to the original article...

Leave a Reply