MIPI Test Board for Legacy ATE

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PRWeb: Introspect Technology releases its SV4D Direct Attach MIPI Test Module that enables at-speed production testing for MIPI C-PHY or D-PHY transmitter or receiver interfaces.

Whereas we could use conventional ATE for DC parametric testing and a loop-back methodology for high-speed testing on our standard SerDes interfaces, we could not find a solution that could provide the necessary fault coverage for the MIPI ports on our devices,” said Ibrahim Aljabiri, Sr. Manager, Product & Test Engineering, Synaptics. “The SV4D’s strong MIPI features, high operating speed, and compact size allowed us to deploy a high-parallelism multi-site solution on our existing ATE.

Mohamed Hafed, CEO of Introspect Technology, explains, “we found that product engineers all over the world were looking for mimicking system-level functionality as much as possible during wafer sort and final test. So, we set out to create a production test module that leveraged our unique monolithic MIPI physical layers to deliver exactly that. Not only is the SV4D able to perform structural testing using abbreviated device test modes, but it is also able to completely exercise the link and software layers of devices under test.


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