Senseeker Introduces Oxygen DROIC Quarter Wafers

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Senseeker Engineering introduces quarter wafers of the Oxygen RD0092 digital readout IC (DROIC). This allows customers to acquire a reduced minimum order quantity of ICs at lower-cost for evaluation and prototyping.

Each fully tested quarter wafer is supplied with a minimum number of guaranteed good die. A full data pack that includes a GUI-based clickable wafer map is also furnished. The wafer map provides color-coded grade information for each die along with a top-level summary (die yield, results of each individual test, and final grade). Clicking any die on the map displays a detailed test summary plot that contains test images, histograms for the test images, pixelwise differences used to reject bad pixels with pass/fail thresholds indicated, bad pixel map image and a bar graph showing the measured supply currents in the screen test state.

To further simplify the evaluation and development experience using the Oxygen RD0092, Senseeker offers an evaluation kit that can be used for cooled or uncooled lab testing. The evaluation kit comes complete with software and is easily connected to a host PC with a frame grabber card for image display.

"We are focused on making it as inexpensive and easy as possible for customers to get up-and-running with Senseeker's commercial readout products," said Kenton Veeder, President at Senseeker Engineering. "Our goal is to lower the barriers-to-entry of using advanced digital readout ICs by making them available off-the-shelf in lower quantities than a full wafer. We also believe that it is critical to provide the whole ecosystem of tools that are required to expedite the development process."




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